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Semiconductor Wafer/Ultra Micro Circuit Appearance AOI
Semiconductor Wafer/Ultra Micro Circuit Appearance AOIBuilding Materials/Screen Printing/White Glass/Cover/Coated Glass AOIBacklight AOIOLED/ LCD class AOIFilm/coating class AOIOther 3C AOI
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Automatic detection of wafer appearance AOI
Automatic detection of wafer appearance AOIRectifier diode chip automatically detects AOIBluetooth chip detects AOI automaticallyMINILED金线嵌合自动AOIIC appearance automatically detects AOIAutomatic detection of AOI by ultramicroline
晶圆芯片外观自动检测AOI
  • 晶圆芯片外观自动检测AOI

晶圆芯片外观自动检测AOI

Equipment specifications and parametersMAP Diagram DisplayDemonstration of wafer chip defect imaging effect

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说明:

1、AOI根据芯片的检测结果自动生成MAP如图

2、MAP读取格式为wafermap，生成的MAP格式，包含有图片，txt和xml

3、不同NG类别可输出不同bin的要求 （map图片颜色区别)，同时可输出检验清单，包含不良分bin统计的数量

4、还可以根据客户的MAP格式要求修订MAP的内容




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